Comparing the performance of single and multifrequency Kelvin probe force microscopy techniques in air and water

• Jason I. Kilpatrick,
• Emrullah Kargin and
• Brian J. Rodriguez

Beilstein J. Nanotechnol. 2022, 13, 922–943, doi:10.3762/bjnano.13.82

• techniques to yield multidimensional data sets and aid in isolation of the influence of electrostatic potential, for example, PeakForce infrared-KPFM (PFIR-KPFM) [66], nanomechanical mapping + KPFM [67][68], magnetic force microscopy (MFM) + KPFM [69], piezoresponse force microscopy (PFM) + KPFM [70], and G

An atomic force microscope integrated with a helium ion microscope for correlative nanoscale characterization

• Santiago H. Andany,
• Gregor Hlawacek,
• Stefan Hummel,
• Charlène Brillard,
• Mustafa Kangül and
• Georg E. Fantner

Beilstein J. Nanotechnol. 2020, 11, 1272–1279, doi:10.3762/bjnano.11.111

• [24] with very high resolution. Magnetic properties of nanostructures can be measured using magnetic force microscopy (MFM) [42], and a host of AFM techniques are available to measure electrical properties of samples (e.g., conductive AFM (cAFM) [43], scanning capacitance microscopy (SCM) [44], and

Influence of dielectric layer thickness and roughness on topographic effects in magnetic force microscopy

• Alexander Krivcov,
• Jasmin Ehrler,
• Marc Fuhrmann,
• Tanja Junkers and
• Hildegard Möbius

Beilstein J. Nanotechnol. 2019, 10, 1056–1064, doi:10.3762/bjnano.10.106

• , Clayton VIC 3800, Australia Institute for Materials Research, Hasselt University, Martelarenlaan 42, 3500 Hasselt, Belgium 10.3762/bjnano.10.106 Abstract Magnetic force microscopy (MFM) has become a widely used tool for the characterization of magnetic properties. However, the magnetic signal can be

Size limits of magnetic-domain engineering in continuous in-plane exchange-bias prototype films

• Alexander Gaul,
• Daniel Emmrich,
• Timo Ueltzhöffer,
• Henning Huckfeldt,
• Hatice Doğanay,
• Johanna Hackl,
• Muhammad Imtiaz Khan,
• Daniel M. Gottlob,
• Gregor Hartmann,
• André Beyer,
• Dennis Holzinger,
• Slavomír Nemšák,
• Claus M. Schneider,
• Armin Gölzhäuser,
• Günter Reiss and
• Arno Ehresmann

Beilstein J. Nanotechnol. 2018, 9, 2968–2979, doi:10.3762/bjnano.9.276

• electron microscopy (X-PEEM) and investigating the magnetic charge state of the DWs by magnetic force microscopy (MFM). The experiments have been corroborated by micromagnetic simulations. Results and Discussion The ion bombardment induced magnetic pattering of artificial domains in exchange-bias

High-temperature magnetism and microstructure of a semiconducting ferromagnetic (GaSb)_1−x(MnSb)_x alloy

• Leonid N. Oveshnikov,
• Elena I. Nekhaeva,
• Alexey V. Kochura,
• Alexander B. Davydov,
• Mikhail A. Shakhov,
• Sergey F. Marenkin,
• Oleg A. Novodvorskii,
• Alexander P. Kuzmenko,
• Alexander L. Vasiliev,
• Boris A. Aronzon and
• Erkki Lahderanta

Beilstein J. Nanotechnol. 2018, 9, 2457–2465, doi:10.3762/bjnano.9.230

• (FEI, US) was used for image analysis. P. Stadelmann’s JEMS software [16] was used for the simulation of diffraction patterns and images. Scanning atomic force microscopy (AFM) and magnetic force microscopy (MFM) images were obtained on an SmartSPM microscope (AIST-NT, US) at temperatures of T = 295

Magnetic characterization of cobalt nanowires and square nanorings fabricated by focused electron beam induced deposition

• Federico Venturi,
• Gian Carlo Gazzadi,
• Amir H. Tavabi,
• Alberto Rota,
• Rafal E. Dunin-Borkowski and
• Stefano Frabboni

Beilstein J. Nanotechnol. 2018, 9, 1040–1049, doi:10.3762/bjnano.9.97

• nanowires (NWs) and square nanorings, which were deposited by focused electron beam induced deposition (FEBID) of a Co carbonyl precursor, are studied using off-axis electron holography (EH), Lorentz transmission electron microscopy (L-TEM) and magnetic force microscopy (MFM). EH shows that NWs deposited

• orientation, while magnetostatic interactions between different sides give rise to different possible magnetization states [18]. Extensive work has previously been performed on Co nanostructures using magnetic force microscopy (MFM) [19][20], Lorentz-transmission electron microscopy (L-TEM) [21] and electron

Comparative study of post-growth annealing of Cu(hfac)₂, Co₂(CO)₈ and Me₂Au(acac) metal precursors deposited by FEBID

• Marcos V. Puydinger dos Santos,
• Aleksandra Szkudlarek,
• Artur Rydosz,
• Carlos Guerra-Nuñez,
• Fanny Béron,
• Kleber R. Pirota,
• Stanislav Moshkalev,
• José Alexandre Diniz and
• Ivo Utke

Beilstein J. Nanotechnol. 2018, 9, 91–101, doi:10.3762/bjnano.9.11

• -based devices [28]. Furthermore, the possibility of depositing 3D nanostructures with high aspect ratio makes FEBID an adequate tool for the fabrication of advanced scanning-probe systems, as well as high-resolution ferromagnetic probes for magnetic force microscopy (MFM) [29][30][31]. Nevertheless, the

Magnetic properties of optimized cobalt nanospheres grown by focused electron beam induced deposition (FEBID) on cantilever tips

• Soraya Sangiao,
• César Magén,
• Darius Mofakhami,
• Grégoire de Loubens and
• José María De Teresa

Beilstein J. Nanotechnol. 2017, 8, 2106–2115, doi:10.3762/bjnano.8.210

• of tip cantilevers with applications in magnetic force microscopy (MFM) [7][8][9][10] and magnetic resonance force microscopy (MRFM) [11]; (c) planar nanowires for application in magnetic domain-wall conduits [12][13], in logic circuits [14][15], in dense memory arrays [16] and for superconducting

Grazing-incidence optical magnetic recording with super-resolution

• Gunther Scheunert,
• Sidney. R. Cohen,
• René Kullock,
• Ryan McCarron,
• Katya Rechev,
• Ifat Kaplan-Ashiri,
• Ora Bitton,
• Paul Dawson,
• Bert Hecht and
• Dan Oron

Beilstein J. Nanotechnol. 2017, 8, 28–37, doi:10.3762/bjnano.8.4

• ): for a wavelength of 785 nm the calculated beam waist is wB = 3.4 μm and the FWHM of the Gaussian is wFWHM = 2.9 μm, assuming a spherical beam under normal incidence (for 532 nm: wB = 2.3 μm and wFWHM = 2.0 μm). Furthermore, both AFMs were used for magnetic force microscopy (MFM) using Bruker MESPTMMFM

Nanoanalytics for materials science

• Thilo Glatzel and
• Tom Wirtz

Beilstein J. Nanotechnol. 2016, 7, 1674–1675, doi:10.3762/bjnano.7.159

• morphology of Si nanocrystal ensembles without the limitations imposed by standard cross sectional TEM investigations. Advances in preparing high-performance probes for magnetic force microscopy (MFM), with a particular focus on controlling and tuning the tip stray field, are presented by Iglesias-Freire and

Customized MFM probes with high lateral resolution

• Óscar Iglesias-Freire,
• Miriam Jaafar,
• Eider Berganza and
• Agustina Asenjo

Beilstein J. Nanotechnol. 2016, 7, 1068–1074, doi:10.3762/bjnano.7.100

• Abstract Magnetic force microscopy (MFM) is a widely used technique for magnetic imaging. Besides its advantages such as the high spatial resolution and the easy use in the characterization of relevant applied materials, the main handicaps of the technique are the lack of control over the tip stray field

• ); AFM probes; high-resolution microscopy; magnetic force microscopy (MFM); magnetic materials; Introduction Conventional MFM probes consist of pyramidal Si or SiN tips with a ferromagnetic thin film coating (generally a CoCr alloy) mounted on a cantilever with resonance frequency and spring constant of

Magnetic switching of nanoscale antidot lattices

• Ulf Wiedwald,
• Joachim Gräfe,
• Kristof M. Lebecki,
• Maxim Skripnik,
• Felix Haering,
• Gisela Schütz,
• Paul Ziemann,
• Eberhard Goering and
• Ulrich Nowak

Beilstein J. Nanotechnol. 2016, 7, 733–750, doi:10.3762/bjnano.7.65

• magnetometry are always comprised of contributions from all possible antidot orientations leading to orientation averaging. As will be demonstrated below, MOKE microscopy has sufficient spatial resolution for magnetic measurements of a coherent part of the hexagonal antidot lattice, magnetic force microscopy

• (MFM), and scanning transmission X-ray microscopy (STXM) deliver magnetic maps even down to a single antidot unit cell. One example of the prepared antidot lattices is displayed in Figure 2. The scanning electron microscopy (SEM) image shows a Fe antidot array with a = 200 nm, d = 125 nm and thickness

Formation of pure Cu nanocrystals upon post-growth annealing of Cu–C material obtained from focused electron beam induced deposition: comparison of different methods

• Aleksandra Szkudlarek,
• Alfredo Rodrigues Vaz,
• Yucheng Zhang,
• Andrzej Rudkowski,
• Czesław Kapusta,
• Rolf Erni,
• Stanislav Moshkalev and
• Ivo Utke

Beilstein J. Nanotechnol. 2015, 6, 1508–1517, doi:10.3762/bjnano.6.156

• with a high aspect ratio makes FEBID suitable for fabrication of high resolution probes to scanning magnetic force microscopy (MFM) [17][18][19]. Purification methods of FEBID structures For FEBID direct-write nanostructures lateral resolution can be well-controlled by adjusting the beam and gas flow

Tunable magnetism on the lateral mesoscale by post-processing of Co/Pt heterostructures

• Oleksandr V. Dobrovolskiy,
• Maksym Kompaniiets,
• Roland Sachser,
• Fabrizio Porrati,
• Christian Gspan,
• Harald Plank and
• Michael Huth

Beilstein J. Nanotechnol. 2015, 6, 1082–1090, doi:10.3762/bjnano.6.109

• [3] and memory [4], fabrication of Hall sensors [5] and cantilever tips [6] for magnetic force microscopy (MFM). In particular, the ability to tune the magnetization is the basic property needed for the realization of stacked nanomagnets [7], pinning of magnetic domain walls [8] and Abrikosov

Manipulation of magnetic vortex parameters in disk-on-disk nanostructures with various geometry

• Maxim E. Stebliy,
• Alexander G. Kolesnikov,
• Alexey V. Ognev,
• Alexander S. Samardak and
• Ludmila A. Chebotkevich

Beilstein J. Nanotechnol. 2015, 6, 697–703, doi:10.3762/bjnano.6.70

• . Moreover, the trajectory of a vortex core is distorted and its gyrotropic motion frequency changes significantly. Recently, by using magnetic force microscopy (MFM), we have demonstrated a reliable method to control the vortex parameters in a big disk if a disk with smaller diameter is placed on its top [8

qPlus magnetic force microscopy in frequency-modulation mode with millihertz resolution

• Maximilian Schneiderbauer,
• Daniel Wastl and
• Franz J. Giessibl

Beilstein J. Nanotechnol. 2012, 3, 174–178, doi:10.3762/bjnano.3.18

• Maximilian Schneiderbauer Daniel Wastl Franz J. Giessibl Institute of Experimental and Applied Physics, University of Regensburg, 93040 Regensburg, Germany 10.3762/bjnano.3.18 Abstract Magnetic force microscopy (MFM) allows one to image the domain structure of ferromagnetic samples by probing the

• between a tip atom with fixed spin orientation and a sample atom is measured (Figure 1c). Imaging magnetic domains by Magnetic Force Microscopy (MFM) [6][7] is nowadays well-established. MFM images the magnetic-dipole interaction of a ferromagnetic tip and a domain-structured sample (Figure 1a). Typically

Distinguishing magnetic and electrostatic interactions by a Kelvin probe force microscopy–magnetic force microscopy combination

• Miriam Jaafar,
• Oscar Iglesias-Freire,
• Luis Serrano-Ramón,
• Manuel Ricardo Ibarra,
• Jose Maria de Teresa and
• Agustina Asenjo

Beilstein J. Nanotechnol. 2011, 2, 552–560, doi:10.3762/bjnano.2.59

• , Spain 10.3762/bjnano.2.59 Abstract The most outstanding feature of scanning force microscopy (SFM) is its capability to detect various different short and long range interactions. In particular, magnetic force microscopy (MFM) is used to characterize the domain configuration in ferromagnetic materials

• every kind of force to the total force measured leads to serious problems for obtaining quantitative information from the measurements [4]. Among those SFM techniques, magnetic force microscopy (MFM) [5] was developed to characterize the domain configuration of ferromagnetic thin films, rather than the